Are there any limitations on the width of the metal if there is a large current running through? Where can I find the documentation for this?

I have not found any electromigration limits in the SkyWater documentation. I came up with a value based on material (Aluminum) and thickness and some published values. I have the value written down somewhere and I need to look it up. . . maybe @Weston Braun knows the value?

Thanks! Can you show me the value you use? I am working with a power amplifier and the current could reach hundreds of mA. The value is critical.....

These are the values that I came up with for electromigration limits based on a similar process: metal1/metal2: 0.65mA/um metal3/metal4: 1.5mA/um metal5: 2.3mA/um Since both processes use aluminum interconnect I expect that the limit values should be reasonably close to what you can expect from the SkyWater process.

Thanks a lot!