Yes, there will be errors due to transistor bends. I am implementing DRC checks following the SkyWater rules as closely as possible. However, transistor bends will not cause a layout to be rejected from fab, and there is even one SkyWater layout of an ESD transistor that has flanged ends on the gate, and so requires a DRC rule exception. There have been several designs taped out with annular transistors, so it will require testing some of these designs and getting an understanding of how reliable the layouts are; then maybe I can override the SkyWater rules, at least for selected specific annular device layouts.