From S. M. Sze, "VLSI Technology": Vt = phi_ms - (Qf / Cox) + 2 * psi_b - (Qb / Cox), where phi_ms is the metal-silicon work function of the gate material, Qf is the charge in the gate oxide, psi_b is the substrate Fermi potential, Qb is the depletion region charge in the substrate, and Cox is the capaitance of the gate. Qb is proportional to the square root of the channel doping. While doping the polysilicon gate will change the threshold, the most common threshold adjustment is to dope the channel under the gate.