Hi all, LTC2 gds has `IO.0` drc errors on COMP th...
# ieee-sscs-dc-23
a
Hi all, LTC2 gds has
IO.0
drc errors on COMP that already have
Latchup_MK
over it. How to fix that error?
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1. To flag I/O latch-up related violation:
    (a) Non well tap COMP directly connected to PAD is recommended to be marked by "Latchup_MK" layer
    (b) Min/max Latchup_MK layer overlap of COMP (directly connected to Pad) LV=0 MV=0
m
@aquiles viza Is this related to this previous discussion? If it is, the device may be too big to pass the
IO.0
rule. Maybe a screen shot and explanation would be enough for CMC/GF to waive this DRC error. https://open-source-silicon.slack.com/archives/C04MJUYP99V/p1715698171145149?thread_ts=1715666213.928639&cid=C04MJUYP99V
a
I would say it's not related, because this error happens on another design (image1) and some of the waffle COMP despite having the
Latchup_MK
layer over them.
In both cases, is COMP + NPlus
m
The first one appears to be missing a double guardring. Could that be the problem/
a
Yep, the first design doesn't have the guard rings, but we though those errors were indicated with other
IO
errors, not with
IO.0
.