@Tim Edwards @Andrew Wright thanks for the feedback the other day. Regarding your comment about process monitoring, I'm wondering how to distinguish between nmos and pmos corner variation using ring oscillators to generate a LUT. Any thoughts or relevant references on this? Cc @aquiles viza

@Andrew Wright: Any ideas?

Hello @Tim Edwards @Andrew Wright, we would really appreciate your help with this

The one thing that came to my mind was to make a ring oscillator with nFET only and pull-up resistors, and another one with pFET only and pull-down resistors. But then that would involve resistor variation. Possibly you could make one nMOS-only ring oscillator, one pMOS-only, and one CMOS. Then you have three measurements for three independent variables (N-corner, P-corner, and R-corner) and can tease them apart.