π Dive deep into VLSI Testing and DFT with our comprehensive webinar! Whether you're a beginner or looking to advance your knowledge, this course has everything you need. π
Contact to book - https://api.whatsapp.com/send/?phone=919817182494&text=Hi+vlsideepdive%2C+I+have+a+query&type=phone_number&app_absent=0
π Topics Covered:
-> Introduction to VLSI Testing
-> Logic Simulation
-> Fault Modeling
-> Fault Collapse
-> Fault Simulation
-> Testability
-> Combinational ATPG
-> Sequential ATPG
-> Delay Test
-> Physical Failure Analysis
-> Design For Testability (DFT) Introduction
-> DFT Internal Scan Chains
-> DFT External Scan (JTAG)
-> Logic Built-In Self Test (BIST)
-> BIST Architecture
-> Test Compression
-> Memory Testing
-> Boolean Testing without Fault Model
-> Memory Diagnosis and Built-In-Self-Repair
-> Boundary Scan and Core-Based Testing
-> Analog and Mixed-Signal Testing
-> Upcoming Trends in Testing
π Book your spot now - https://api.whatsapp.com/send/?phone=919817182494&text=Hi+vlsideepdive%2C+I+have+a+query&type=phone_number&app_absent=0
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