DFT for chiplets! When it comes to chiplets, which are modular components that can be combined to create a larger system, DFT becomes even more important. Don't miss upcoming DFT workshop - contact to book - https://api.whatsapp.com/send/?phone=919817182494&text=Hi+vlsideepdive%2C+I+have+a+query&type=phone_number&app_absent=0 Here are some key considerations for DFT in chiplets: Boundary Scan (JTAG): Implementing a standardized boundary scan (IEEE 1149.1 JTAG) helps in testing the interconnections between chiplets and their interfaces. This allows for easy debugging and testing of the connections without the need for physical probes. Hierarchical DFT: Since chiplets are modular, it's essential to implement hierarchical DFT techniques. Each chiplet should be designed with its own test infrastructure, allowing individual testing of chiplets before integration into the larger system. Built-In Self-Test (BIST): Implementing BIST features within each chiplet enables the chiplet to perform self-tests without relying on external test equipment. BIST can help identify faults within the chiplet itself, improving fault coverage and reducing the need for external test resources. Inter-Chiplet Test Access Mechanisms (TAM): Establishing efficient test access mechanisms between chiplets is crucial for testing the overall system. This involves designing robust interconnects and test interfaces to ensure that test patterns can be easily applied and observed across chiplet boundaries. On-Chip Sensors and Monitoring: Integrating on-chip sensors can aid in monitoring the health and performance of the chiplets during operation. This can be beneficial for identifying issues that may arise during runtime and for implementing effective built-in self-repair mechanisms. Standard Interfaces: Ensure that the chiplet interfaces comply with industry standards, facilitating compatibility with various test equipment. This includes ensuring that test equipment can easily communicate with and control the chiplets during the testing process. Fault Tolerance: Design chiplets with fault-tolerant features to enhance the reliability of the overall system. This includes error correction codes, redundancy, and other techniques that can help the system continue functioning even in the presence of faults. Power Management during Testing: Consider power management aspects during testing to ensure that chiplets operate within specified power constraints. This includes controlling power domains, optimizing test sequences to minimize power consumption, and implementing power-aware testing techniques.